蔡劭璞、Peter J Konijnenberg、Ivan Gonzalez、Samuel Hartke、Thomas A Griffiths、Michael Herbig、Kaori Kawano-Miyata、Akira Taniyama、Naoyuki Sano、Stefan Zaefferer：Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel, Review of Scientific Instruments, Vol. 93, Issue 9, 093707 (Sep. 2022)
三維材料分析技術(圖一)對於分析材料特徵以及研究材料科學十分重要。舉結晶材料中的二維缺陷‒晶界為例子：一般在傳統金相試片中，晶界通常呈現線段形貌。這麼一來三維空間當中晶界的曲面、面的晶體資訊、以及晶界之間的交互關係並沒有辦法得知，而這些晶界相關的變數會影響到材料的表現，例如疲勞、晶界腐蝕、熱電以 ...更多